202002024I : S32K1xx Data Sheet Update To Rev 12 And Reference Manual Update to Rev 12.1

NXP Semiconductors announces data sheet and reference manual update for the S32K1xx from revision 11 to revision 12 and revision 12.1 respectively. The revision history included in the updated document provides a details description of the changes.Data sheet changes:1. Page 1: Added note: Technical information for S32K142W and S32K144W device families is preliminary until these devices achieve qualification.........2. Entire document: Added S32K14xW information throughout.3. Page 6: Removed "Under development" from the footnote number 6 in Figure 3.4. Page 80: Updated Trace electrical specifications to clarify that the section applies only for ETM Trace and is supported only by S32K148.5. Page 39: In Table 28 added a new footnote from fosc_hi Max entry.6. Page 71: Updated Figure 21 for number 8.7. Page 49: In Reliability specifications tnvmretee is changed to tnvmretee100 and added a new row for the parameter tnvmretee10. And footnotes are updated in this topic.For reference manual changes please refer to Appendix B release notes for revision 12.1.The S32K1xx data sheet and reference manual revision 12 is attached to this notification and can be found at:https://www.nxp.com/products/processors-and-microcontrollers/arm-microcontrollers/s32k-automotive-mcus/s32k-scalable-microcontrollers-for-automotive-general-purpose-and-and-high-reliability-industrial:S32K?tab=Documentation_TabCorresponding ZVEI Delta Qualification Matrix ID: SEM-DS-02

Reason of Change

The data sheet and reference manual have been updated to provide additional technical clarification.

Identification of Affected Products

Product identification does not change

Anticipated Impact

Data sheet revision: A new datasheet will be issued

No impact on form fit function reliability or quality.

Affected Parts