RDGD31603PHSEVM reference design and evaluation kit | NXP Semiconductors

3-Phase Reference Design for VE-Trac Drive SiC Module Featuring GD3160

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Block Diagram

GD3160 Block Diagram

GD3160 Block Diagram

Supported Devices

Processors and Microcontrollers

Ultra-Reliable MPC57xx MCUs

Power Management

Powertrain and Engine Control

System Basis Chips

Interfaces

3.3 V / 5 V IO CAN Transceivers

Features

Gate Driver

  • Integrated Galvanic signal isolation (up to 8 kV)
  • High gate current integrated: 15 A source/sink capable
  • SPI interface for safety monitoring, configuration, and diagnostic reporting
  • Fail-safe state management from LV and HV domain for user-selectable safe state
  • Temperature sense compatible with diode-based temperature sensors, NTC and PTC thermistors
  • Configurable desaturation and current sense optimized for protecting SiC and IGBTs
  • Integrated soft shutdown, two-level turn-off, optimized for unique gate drive requirements of SiC
  • Integrated ADC for monitoring parameters from HV domain
  • CMTI > 100 V/ns
  • Available in 5.0 or 3.3 V logic interface variants
  • Certified compliant with ISO 26262, supporting ASIL D level functional safety

GD3160

  • Advanced single channel gate driver for IGBT and SiC MOSFETs. Integrated galvanic isolation and low on-resistance drive transistors provide high charging and discharging current, low dynamic saturation voltage and rail-to-rail gate voltage control

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  • RDGD31603PHSEVM
    Active

  • 3-Phase Reference Design for VE-Trac Drive SiC Module Featuring GD3160.

  • $437.50 USD
  • For a quantity of 1
    • Availability: Pending Stock
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Documentation

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2 documents

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Design Files

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2 design files

Software

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1 software file

Note: For better experience, software downloads are recommended on desktop.

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