201801012F01 : i.MX 6SoloX MAPBGA17X17 and MAPBGA14X14 Room Test Elimination at Final Test
NXP Semiconductors announces the room temperature test elimination from the Final Test production flow for i.MX 6SoloX MAPBGA17X17 and MAPBGA14X14 devices associated with this notification. Room test performance is covered by Probe Test and the remaining Final Test production flow. Current Production Final Test Flow:Hot Final Test - Cold Final Test - Room Final Test with in-line QA Gate TestsNew Production Final Test Flow:Hot Final Test - Cold Final Test with in-line QA Gate TestsThis evaluation has been successfully completed according to NXP specifications.Corresponding ZVEI Delta Qualification Matrix ID: SEM-QG-01
| PCN Type | Change Category | Issue Date | Effective Date |
|---|---|---|---|
| Final Product Change Notification | Test process | 14-Feb-2018 | 15-May-2018 |
Reason of Change
Qualification of room temperature test elimination for improved capacity and customer supply assurance
Identification of Affected Products
Product identification does not change
Anticipated Impact
No impact on form fit function reliability or quality.
Affected Parts
| Part Number / 12NC | Last Time Buy Date | Last Time Delivery Date | Replacement Part |
|---|---|---|---|
|
MCIMX6X1AVK08AB (935315934557) |
- | - | - |
|
MCIMX6X1AVK08AC (935363026557) |
- | - | - |
|
MCIMX6X1AVO08AB (935323753557) |
- | - | - |
|
MCIMX6X1AVO08AC (935353852557) |
- | - | - |
|
MCIMX6X1AVO08ACR (935353852518) |
- | - | - |
|
MCIMX6X2AVN08AB (935315812557) |
- | - | - |
|
MCIMX6X2AVN08AC (935363894557) |
- | - | - |