Demystifying Extended Mission Profiles in Automotive and Beyond

placeholder

Author

Rene Rongen

Rene Rongen

René is actively representing NXP in industry standardization bodies and industrial forums like AEC, JEDEC and ZVEI. As such, he has contributed to the latest revision of AEC-Q100 and -Q006, JESD47 and ZVEI Handbook for Robustness Validation. He is (co)author of many papers in the field of semiconductor reliability. He is regularly visiting conferences and workshops, like IRPS, ESREF, ECTC and AEC-RW, to present papers or as invited speaker. In addition, he is technical committee member for ECTC, ESREF and ESTC and in 2023 he organized the AEC-RW Europe edition. Finally, he is lead author of NXP’s Reliability Policy and Requirements, owner of all product reliability test specs in NXP and the NXP Reliability Knowledge Framework.