TDA8034T/C1,118

As a proactive and sustainable company, NXP has decided to publish chemical content information of its product portfolio through direct Internet access.
With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

Download

NXP Semiconductors
Product content declaration of TDA8034T/C1,118Last Revision (GMT):
Sunday, 15 September 2024, 10:55:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
TDA8034T/C1,118SOT109SO16135.213164 mg NoYesYesNickel/Palladium/Gold (Ni/Pd/Au)Cu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9352 883 491182024-07-1261 / Unlimited26030 sec.1 / Unlimited24020 sec.3Bangkok, Thailand
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AuBonding Wire - AuCalcium and its compoundsCalcium7440-70-20.0000040.0020000.000003
Gold and its compoundsGold, metal7440-57-50.21540698.8400000.159308
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.0000170.0080000.000013
Palladium and its compoundsPalladium, metal7440-05-30.0025061.1500000.001853
Subtotal0.217934100.00000000.161178
Copper Lead-FrameCopper Lead-FrameCopper and its compoundsCopper, metal7440-50-850.87316097.83300037.624414
Iron and its compoundsIron, metal7439-89-61.0922602.1005000.807806
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0005200.0010000.000385
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.0078520.0151000.005807
Zinc and its compoundsZinc, metal7440-66-60.0262080.0504000.019383
Subtotal52.000000100.000000038.457794
Die EncapsulantDie EncapsulantAntimony OxidesAntimony(III) oxide1309-64-42.4480003.6000001.810475
Epoxy ResinsProprietary Material-Other Epoxy resins15.57200022.90000011.516630
Halogenated Organic CompoundsProprietary Material-Other brominated organic hydrocarbons1.0200001.5000000.754364
Inorganic Silicon compoundsQuartz14808-60-748.96000072.00000036.209492
Subtotal68.000000100.000000050.290961
Epoxy AdhesiveEpoxy AdhesiveOrganic compoundsOther organic compounds.0.0944000.8000000.069816
PolymersPlastic: EP - Epoxide, Epoxy2.97360025.2000002.199194
Silver and its compoundsSilver, metal7440-22-48.73200074.0000006.457951
Subtotal11.800000100.00000008.726961
Pre-plating - Precious metal - NiPdAuPre-plating - Precious metal - NiPdAuGold and its compoundsGold, metal7440-57-50.0141001.0000000.010428
Nickel and its compoundsNickel, metal7440-02-01.36770097.0000001.011514
Palladium and its compoundsPalladium, metal7440-05-30.0282002.0000000.020856
Subtotal1.410000100.00000001.042798
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon7440-21-31.74952598.0000001.293902
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0357052.0000000.026406
Subtotal1.785230100.00000001.320308
Total135.213164100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 TDA8034T/C1,118
Product content declaration of TDA8034T/C1,118
上次修订 Last Revision (GMT):
Sunday, 15 September 2024, 10:55:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-金
Bonding Wire - Au
焊丝-金
Bonding Wire - Au
OOOOOO
铜引线框架
Copper Lead-Frame
铜引线框架
Copper Lead-Frame
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
预电镀-贵金属-镍钯金
Pre-plating - Precious metal - NiPdAu
预电镀-贵金属-镍钯金
Pre-plating - Precious metal - NiPdAu
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of TDA8034T/C1,118Last Revision (GMT):
Sunday, 15 September 2024, 10:55:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AuTest Report
3 Jul 2024
Test Report
3 Jul 2024
Test Report
3 Jul 2024
Test Report
3 Jul 2024
Copper Lead-FrameAU PLATINGTest Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
CDA 194Test Report
5 Feb 2024
Test Report
5 Feb 2024
Test Report
5 Feb 2024
Test Report
5 Feb 2024
NI PLATINGTest Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
PD PLATINGTest Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
Die EncapsulantTest Report
11 Mar 2024
Test Report
11 Mar 2024
Test Report
11 Mar 2024
Test Report
20 Jun 2023
Epoxy AdhesiveTest Report
26 Feb 2024
Test Report
26 Feb 2024
Test Report
26 Feb 2024
Test Report
30 Mar 2023
Pre-plating - Precious metal - NiPdAuTest Report
29 Dec 2023
Test Report
29 Dec 2023
Test Report
29 Dec 2023
Test Report
29 Dec 2023
Semiconductor DieTest Report
18 Jun 2024
Test Report
18 Jun 2024
Test Report
18 Jun 2024
Test Report
18 Jun 2024
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.