MPXHZ6400AC6T1

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MPXHZ6400AC6T1Last Revision (GMT):
Friday, 27 September 2024, 11:04:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MPXHZ6400AC6T1SOT1710-1SO8632.123757 mg YesYesYesOtherCu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 137 491282023-11-245NA / Not Available25030 sec.Not ApplicableNot ApplicableNot Applicable3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AuBonding Wire - AuGold and its compoundsGold, metal7440-57-5100.61239599.99000015.916566
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0100620.0100000.001592
Subtotal100.622457100.000000015.918158
CapCapChromium and Chromium III compoundsChromium, metal7440-47-39.14170011.3000001.446188
Copper and its compoundsCopper, metal7440-50-80.6067500.7500000.095986
Inorganic Silicon compoundsSilicon7440-21-30.4045000.5000000.063991
Inorganic compoundsCarbon7440-44-00.0080900.0100000.001280
Inorganic compoundsSulfur7704-34-90.0040450.0050000.000640
Iron and its compoundsIron, metal7439-89-670.10794086.66000011.090857
Manganese and its compoundsManganese, metal7439-96-50.2022500.2500000.031995
Nickel and its compoundsNickel, metal7440-02-00.1213500.1500000.019197
Phosphorus compoundsPhosphorus, elemental (not containing red allotrope)7723-14-00.1415750.1750000.022397
Titanium and its compoundsTitanium, metal7440-32-60.1618000.2000000.025596
Subtotal80.900000100.000000012.798127
Copper Lead-Frame, Pre-PlatedCopper AlloyCopper and its compoundsCopper, metal7440-50-8205.66844197.60000032.536104
Iron and its compoundsIron, metal7439-89-65.0574212.4000000.800068
Subtotal210.725862100.000000033.336172
Gold PlatingGold and its compoundsGold, metal7440-57-50.07579899.9000000.011991
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000760.1000000.000012
Subtotal0.075873100.00000000.012003
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0010620.1000000.000168
Nickel and its compoundsNickel, metal7440-02-01.06116699.9000000.167873
Subtotal1.062228100.00000000.168041
Palladium PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0001270.1000000.000020
Palladium and its compoundsPalladium, metal7440-05-30.12632999.9000000.019985
Subtotal0.126456100.00000000.020005
Polyimide CoatingInorganic Silicon compoundsFibrous-glass-wool65997-17-322.50659455.0000003.560473
PolymersPolyphenylene Sulfide (PPS)26125-40-618.41448645.0000002.913114
Subtotal40.921081100.00000006.473587
Die Encapsulant 1Die EncapsulantOrganic Silicon compoundsFluorosilicone monomer (fluorosilicone rubber)2374-14-320.74800078.0000003.282269
PolymersOxetane, 2,2,3,3-tetrafluoro-homopolymer, fluorinated113114-19-55.85200022.0000000.925768
Subtotal26.600000100.00000004.208037
Die Encapsulant 2Die EncapsulantOrganic Silicon compoundsFluorosilicone monomer (fluorosilicone rubber)2374-14-320.74800078.0000003.282269
PolymersOxetane, 2,2,3,3-tetrafluoro-homopolymer, fluorinated113114-19-55.85200022.0000000.925768
Subtotal26.600000100.00000004.208037
Epoxy Adhesive 1Epoxy AdhesiveOrganic Silicon compoundsDimethyl,methyl hydrogen siloxane68037-59-20.0180003.0000000.002848
Organic Silicon compoundsSilanamine, 1,1,1-trimethyl-N-(trimethylsilyl)-, reaction products with ammonia, octamethylcyclotetrasiloxane and silica68937-51-90.15000025.0000000.023730
Organic Silicon compoundsSiloxanes and Silicones, di-Me, Me vinyl, vinyl group-terminated68083-18-10.15000025.0000000.023730
Organic Silicon compoundsSiloxanes and silicones, di-Me, vinyl group-terminated68083-19-20.28200047.0000000.044611
Subtotal0.600000100.00000000.094918
Epoxy Adhesive 2Epoxy AdhesiveAluminum and its compoundsProprietary Material-Other aluminum compounds0.27000045.0000000.042713
Guanidine compoundsOther guanidine compounds0.0150002.5000000.002373
Inorganic compoundsCarbon Black1333-86-40.0150002.5000000.002373
Phenols and Phenolic ResinsOther phenolic resins0.30000050.0000000.047459
Subtotal0.600000100.00000000.094918
PortPortInorganic Silicon compoundsFibrous-glass-wool65997-17-352.20000040.0000008.257877
Inorganic compoundsCarbon Black1333-86-40.6525000.5000000.103223
Miscellaneous substancesOther miscellaneous substances (less than 10%).1.3050001.0000000.206447
PolymersPolyphenylene Sulfide (PPS)26125-40-676.34250058.50000012.077145
Subtotal130.500000100.000000020.644692
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon7440-21-312.53400498.0000001.982840
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2557962.0000000.040466
Subtotal12.789800100.00000002.023306
Total632.123757100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MPXHZ6400AC6T1
Product content declaration of MPXHZ6400AC6T1
上次修订 Last Revision (GMT):
Friday, 27 September 2024, 11:04:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-金
Bonding Wire - Au
焊丝-金
Bonding Wire - Au
OOOOOO
盖子
Cap
盖子
Cap
OOOOOO
铜引线框架,预镀
Copper Lead-Frame, Pre-Plated
铜合金
Copper Alloy
OOOOOO

镀金材料
Gold Plating
OOOOOO

镀镍层
Nickel Plating
OOOOOO

钯镀层
Palladium Plating
OOOOOO

聚酰亚胺涂料
Polyimide Coating
OOOOOO
芯片密封胶
Die Encapsulant 1
芯片密封胶
Die Encapsulant
OOOOOO
芯片密封胶
Die Encapsulant 2
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 1
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive 2
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
端口
Port
端口
Port
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MPXHZ6400AC6T1Last Revision (GMT):
Friday, 27 September 2024, 11:04:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AuTest Report
5 Mar 2024
Test Report
5 Mar 2024
Test Report
5 Mar 2024
Test Report
5 Mar 2024
CapTest Report
12 Jul 2024
Test Report
12 Jul 2024
Test Report
12 Jul 2024
Test Report
12 Jul 2024
Copper Lead-Frame, Pre-PlatedAU PLATINGTest Report
2 Jan 2024
Test Report
2 Jan 2024
Test Report
2 Jan 2024
Test Report
2 Jan 2024
CDA 194Test Report
24 Jan 2024
Test Report
24 Jan 2024
Test Report
24 Jan 2024
Test Report
24 Jan 2024
FORTRON RESINTest Report
23 Jan 2024
Test Report
23 Jan 2024
Test Report
23 Jan 2024
Test Report
23 Jan 2024
NI PLATINGTest Report
2 Jan 2024
Test Report
2 Jan 2024
Test Report
2 Jan 2024
Test Report
2 Jan 2024
PD PLATINGTest Report
2 Jan 2024
Test Report
2 Jan 2024
Test Report
2 Jan 2024
Test Report
2 Jan 2024
Die Encapsulant 1Test Report
14 Nov 2023
Test Report
14 Nov 2023
Test Report
14 Nov 2023
Test Report
14 Nov 2023
Die Encapsulant 2Test Report
14 Nov 2023
Test Report
14 Nov 2023
Test Report
14 Nov 2023
Test Report
14 Nov 2023
Epoxy Adhesive 1Test Report
26 Mar 2024
Test Report
26 Mar 2024
Test Report
26 Mar 2024
Test Report
26 Mar 2024
Epoxy Adhesive 2Test Report
12 Dec 2023
Test Report
12 Dec 2023
Test Report
12 Dec 2023
Test Report
12 Dec 2023
PortTest Report
28 Dec 2023
Test Report
28 Dec 2023
Test Report
28 Dec 2023
Not Available
Semiconductor DieTest Report
2 Jun 2021
Test Report
2 Jun 2021
Test Report
2 Jun 2021
Test Report
2 Jun 2021
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.