MIMX8DL1CVNFZAB

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
NXP products are compliant to the EU Directives RoHS, ELV and the China RoHS.
Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of MIMX8DL1CVNFZABLast Revision (GMT):
Thursday, 08 August 2024, 06:51:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
MIMX8DL1CVNFZABSOT2007LBGA388634.952000 mg YesYesYesTin/Bismuth (SnBi)Othere6contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9354 451 695572024-08-0873 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon7440-21-325.34476098.0000003.991602
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.5172402.0000000.081461
Subtotal25.862000100.00000004.073064
Solder Ball - Lead Free with BismuthSolder Ball - Lead Free with BismuthBismuth and its compoundsBismuth, metal7440-69-91.5717003.0000000.247530
Copper and its compoundsCopper, metal7440-50-80.2619500.5000000.041255
Germanium and its compoundsGermanium7440-56-40.0052390.0100000.000825
Nickel and its compoundsNickel, metal7440-02-00.0261950.0500000.004125
Silver and its compoundsSilver, metal7440-22-42.0956004.0000000.330041
Tin and its compoundsTin, metal7440-31-548.42931692.4400007.627241
Subtotal52.390000100.00000008.251017
SubstrateCopper FoilCopper and its compoundsCopper, metal7440-50-8190.31150899.90000029.972582
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.1905020.1000000.030003
Subtotal190.502010100.000000030.002585
SolderCopper and its compoundsCopper, metal7440-50-81.91660696.5000000.301851
Silver and its compoundsSilver, metal7440-22-40.0099310.5000000.001564
Tin and its compoundsTin, metal7440-31-50.0595843.0000000.009384
Subtotal1.986120100.00000000.312798
Solder MaskBarium and its compoundsBarium sulfate7727-43-73.51708825.0000000.553914
Inorganic Silicon compoundsSilica, vitreous60676-86-01.40683510.0000000.221566
Organic compoundsOther organic compounds.0.7034185.0000000.110783
PolymersPlastic: EP - Epoxide, Epoxy8.44101060.0000001.329393
Subtotal14.068350100.00000002.215656
Substrate Build UpEpoxy ResinsBisphenol A diglycidyl ether1675-54-312.54521710.4500001.975774
Epoxy ResinsPhenolic Polymer Resin, Epikote 1559003-36-512.54521710.4500001.975774
Inorganic Silicon compoundsSilicon dioxide7631-86-950.24089241.8500007.912549
PolymersPlastic: EP - Epoxide, Epoxy44.71859537.2500007.042831
Subtotal120.049920100.000000018.906928
Substrate CoreInorganic Silicon compoundsFibrous-glass-wool65997-17-3112.54680050.00000017.725245
Inorganic Silicon compoundsSilica, vitreous60676-86-045.01872020.0000007.090098
PolymersPlastic: EP - Epoxide, Epoxy67.52808030.00000010.635147
Subtotal225.093600100.000000035.450491
UnderfillUnderfillInorganic Silicon compoundsSilica, vitreous60676-86-03.00000060.0000000.472477
Inorganic compoundsCarbon Black1333-86-40.0050000.1000000.000788
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.0450000.9000000.007087
PolymersPlastic: EP - Epoxide, Epoxy1.95000039.0000000.307110
Subtotal5.000000100.00000000.787461
Total634.952000100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 MIMX8DL1CVNFZAB
Product content declaration of MIMX8DL1CVNFZAB
上次修订 Last Revision (GMT):
Thursday, 08 August 2024, 06:51:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
焊锡球-含铋无铅
Solder Ball - Lead Free with Bismuth
焊锡球-含铋无铅
Solder Ball - Lead Free with Bismuth
OOOOOO
基板
Substrate
铜箔
Copper Foil
OOOOOO

焊料
Solder
OOOOOO

阻焊层
Solder Mask
OOOOOO

有机底物堆积
Substrate Build Up
OOOOOO

有机基质芯
Substrate Core
OOOOOO
底注
Underfill
底注
Underfill
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of MIMX8DL1CVNFZABLast Revision (GMT):
Thursday, 08 August 2024, 06:51:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Semiconductor DieNot AvailableNot AvailableNot AvailableNot Available
Solder Ball - Lead Free with BismuthTest Report
16 Sep 2024
Test Report
16 Sep 2024
Test Report
16 Sep 2024
Test Report
16 Sep 2024
SubstrateCU FOILTest Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
E700GRTest Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
Test Report
7 Dec 2023
GX-13Test Report
4 Mar 2024
Test Report
4 Mar 2024
Test Report
4 Mar 2024
Test Report
4 Mar 2024
SOLDER MASKTest Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
Test Report
13 Dec 2023
SOPTest Report
31 Jan 2024
Test Report
30 Jan 2024
Test Report
30 Jan 2024
Test Report
31 Jan 2024
UnderfillTest Report
11 Sep 2024
Test Report
11 Sep 2024
Test Report
12 Oct 2023
Test Report
12 Oct 2023
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.