202207012I : MC56F837xxA Cold Test Elimination
NXP Semiconductors announces cold temperature test elimination from the Final Test production flow for the MC56F837xxA associated with this notification. Cold test performance is covered by Probe Test and the remaining Final Test production flow. Current Production Final Test Flow: ROOM Final Test - HOT Final Test - COLD Final Test with in-line QA Gate Tests New Production Final Test Flow: ROOM Final Test - HOT Final Test with in-line QA Gate Tests This evaluation has been successfully completed according to NXP specifications. Corresponding ZVEI Delta Qualification Matrix ID: SEM-QG-01
| PCN Type | Change Category | Issue Date | Effective Date |
|---|---|---|---|
| Customer Information Notification | Test process | 28-Jul-2022 | 25-Aug-2022 |
Reason of Change
Qualification of cold temperature test elimination for improved capacity and customer supply assurance.
Affected Parts
| Part Number / 12NC | Last Time Buy Date | Last Time Delivery Date | Replacement Part |
|---|---|---|---|
|
MC56F83763AMLHA (935406667557) |
- | - | - |
|
MC56F83763AVLHA (935406668557) |
- | - | - |
|
MC56F83769AMLLA (935406669557) |
- | - | - |
|
MC56F83769AVLLA (935406671557) |
- | - | - |
|
MC56F83783AMLHA (935406672557) |
- | - | - |
|
MC56F83783AVLHA (935406673557) |
- | - | - |
|
MC56F83789AMLLA (935406674557) |
- | - | - |
|
MC56F83789AVLLA (935406675557) |
- | - | - |
|
MWCT2013AVLH (935409518557) |
- | - | - |
|
MWCT20C3AVLH (935409519557) |
- | - | - |
|
MWCT22C3AVLH (935409521557) |
- | - | - |
|
MWCT22C3AVLL (935409522557) |
- | - | - |