201711004I:MC9328MX21 MC56F825x/MC56F824x 56F8013 Final Test Site Expansion from NXP-ATTJ to KESC Tianjin China
  • Product Change Notification (PCN)
  • 201711004I

201711004I : MC9328MX21 MC56F825x/MC56F824x 56F8013 Final Test Site Expansion from NXP-ATTJ to KESC Tianjin China

NXP Semiconductors announces the Final Test site expansion for the MC9328MX21 MC56F825x/MC56F824x 56F8013 product associated with this notification from the current NXP-ATTJ Tianjin China Final Test site to the KESC Tianjin China Final Test site. Final Test site transfer was successfully qualified adhering to NXP specifications. Corresponding ZVEI Delta Qualification Matrix ID: SEM-TF-01Please see the attached files for additional details.

PCN Type Change Category Issue Date Effective Date
Customer Information Notification Test location 21-Dec-2017 19-Jan-2018

Reason of Change

Qualification of KESC Tianjin China is required for manufacturing flexibility and customer supply assurance.

Identification of Affected Products

Product identification does not change

Anticipated Impact

Data sheet revision: No impact to existing datasheet

There is no change to product form fit function or reliability.

Affected Parts

Part Number / 12NC Last Time Buy Date Last Time Delivery Date Replacement Part
MC56F8246VLF
(935321556557)
- - -
MC56F8246VLFR
(935321556528)
- - -
MC9328MX21CVK
(935316662557)
- - -
MC9328MX21DVK
(935322225557)
- - -
S56F8013W3MFAE
(935314709557)
- - -