201901001I : MC14489BDWE and MC14489BPE Product NXP-ATTJ Final Test to KESM Tianjin Final Test Site Transfer
NXP Semiconductors announces the Final Test site transfer for MC14489BDWE and MC14489BPE product from the current NXP-ATTJ Tianjin China Final Test site to the KESM Tianjin Final Test site. Final Test site transfer was successfully qualified adhering to NXP specifications. Please see the attached files for additional details
PCN Type | Change Category | Issue Date | Effective Date |
---|---|---|---|
Customer Information Notification | Test location | 31-Jan-2019 | 05-Mar-2019 |
Reason of Change
Qualification of KESM Tianjin China is required for manufacturing flexibility and customer supply assurance.
Identification of Affected Products
Product identification does not change
Anticipated Impact
No impact on form fit function reliability or quality.
Affected Parts
Part Number / 12NC | Last Time Buy Date | Last Time Delivery Date | Replacement Part |
---|---|---|---|
MC14489BDWE (935309337574) |
- | - | - |
MC14489BDWER2 (935309337518) |
- | - | - |
MC14489BPE (935315222174) |
- | - | - |