201901001I:MC14489BDWE and MC14489BPE Product NXP-ATTJ Final Test to KESM Tianjin Final Test Site Transfer
  • Product Change Notification (PCN)
  • 201901001I

201901001I : MC14489BDWE and MC14489BPE Product NXP-ATTJ Final Test to KESM Tianjin Final Test Site Transfer

NXP Semiconductors announces the Final Test site transfer for MC14489BDWE and MC14489BPE product from the current NXP-ATTJ Tianjin China Final Test site to the KESM Tianjin Final Test site. Final Test site transfer was successfully qualified adhering to NXP specifications. Please see the attached files for additional details

PCN Type Change Category Issue Date Effective Date
Customer Information Notification Test location 31-Jan-2019 05-Mar-2019

Reason of Change

Qualification of KESM Tianjin China is required for manufacturing flexibility and customer supply assurance.

Identification of Affected Products

Product identification does not change

Anticipated Impact

No impact on form fit function reliability or quality.

Affected Parts

Part Number / 12NC Last Time Buy Date Last Time Delivery Date Replacement Part
MC14489BDWE
(935309337574)
- - -
MC14489BDWER2
(935309337518)
- - -
MC14489BPE
(935315222174)
- - -