Adjustment on Voltage Overshoot and Efficiency in xEV Traction Inverters | NXP Semiconductors

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Adjustment on Voltage Overshoot and Efficiency in xEV Traction Inverters

Adjustment on Voltage Overshoot and Efficiency in xEV Traction Inverters

About This Training.

This presentation introduces segmented drive and dynamic gate strength control as two methods to control gate strength and empirically shows the positive impact gate strength has on voltage stress reduction (reliability) and efficiency improvement (range).

What You Will Learn

Range vs reliability - Two opposing forces in xEV inverter design
Inverter design challenges and constrainst that impact reliability
Voltage spike vs current and gate resistance at -25C
Introduction to segmented drive
Introduction of dynamic gate strength control

Presented by

Jerry Rudiak
Sr. Principle Architect/Product Definer, NXP Semiconductors

DURATION

17 min

LANGUAGE

English

SKILL LEVEL

Beginner

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Products Featured in This Training

EV Power Inverter Control Reference Platform Gen 2

EV Power Inverter Control Reference Platform Gen 2

Sample/Buy

Additional Resources

Electric Vehicle (EV) Traction Inverter

Electrification and Powertrain

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