Presented by
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Principal Engineer, NXP Semiconductors
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Systems and Applications Engineer, NXP Semiconductors
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This video offers a review of a model-based top-down development flow for automotive semiconductors in safety related battery management applications. Where other semiconductor flows work mainly bottom-up on silicon faults, we concentrate first on functionality to achieve functional safety. Starting from top level requirements, a function-oriented breakdown of the system behavior is modeled in SysML.
It enables model-based safety analyses that indicate where malfunctions can impact the system behavior and mitigation is required to ensure system safety. This is followed by step-by-step refinement in similar phases: the model is refined according to the requirements, then an analysis step is done that leads to new requirements.
Finally, this results in an IC architecture that fulfills the safety requirements and therefore implements the safety concept. The flow is illustrated by a novel battery monitoring IC architecture that supports high safety demands as well as high performance.
Markus Hafermalz
Systems and Applications Engineer, NXP Semiconductors
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