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Higher Quality, Better Performing IoT Devices with Embedded Observability

About This Training

NXP and Memfault have collaborated to give IoT device manufacturers in-field device monitoring, crash reporting and updating capabilities for faster product development, improved device operation and reduced direct resource costs.

Together, Memfault and NXP are helping IoT developers build smart cities, smart homes, IIoT and automotive devices to save time and ease the worry of triaging and troubleshooting, allowing them to focus on building value-added features.

What You Will Learn

Gain deep insights into embedded device performance in a cloud-based environment
Access debugging information without requiring any user interaction, device RMAs or on-site visits
Orchestrate complex OTA updates of firmware in an organized and controlled manner
Get started with a project example using Memfault and NXP i.MX RT1060 MCUs

Presented by

Kyle Dando
Development Systems Application Engineer, NXP Semiconductors
Devon Yablonski
Head of Strategic Partnerships, Memfault

DURATION

1 hr 5 min

LANGUAGE

English

SKILL LEVEL

Beginner

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