How to Estimate, Validate and Monitor eMMC Device Life Cycle | NXP Semiconductors

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How to Estimate, Validate and Monitor eMMC Device Life Cycle

How to Estimate, Validate and Monitor eMMC Device Life Cycle

About This Training

NAND flash has a functional lifetime that is constrained by flash endurance. Proper consideration and estimation of the storage device lifecycle are critical. This is particularly important for embedded systems with high operational uptime and long lifecycles. This presentation will discuss factors that influence device age and the methods for estimating device lifetime and strategies for boosting device life. Additionally, the considerations for validating actual device lifetime estimates during the prototype phase and ways to monitor device age once in-field are in-field will be covered. We will conclude the session with some of the ready-to-go solutions from NXP partners.

Topics in this webinar:

eMMC devices
Associated memory devices (DDR3L, eMCP, LPDDR4, ,etc.)
NXP’s Arm-based processors

Free memory/storage samples available at NXP@Kingston.com, design guidance, white papers, useful collateral and budgetary price trend.

Presented by

John Terpening
Sr. Engineering Manager, Kingston Technology
Bosco Jung
MPU Partner Program and Marketing Manager, Edge Processing Business Line, NXP Semiconductors

DURATION

1 hr

LANGUAGE

English

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