NTAG 223 / 224 DNA StatusDetect | NFC Chip | Security and Sensing | NXP Semiconductors

NTAG® 223 / 224 DNA StatusDetect - Certified NFC Security and Sensing Solutions to Enable Trusted IoT Applications at Scale

Advance NFC Security and Sensing with NXP’s NTAG 22x DNA Series

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Features

NFC Interface

  • NFC Forum Type 2 Tag and ISO/IEC 14443-A compliant
  • Common Criteria AEL3+ (AVA_VAN.2) certified
  • 7-byte UID
  • 50pF input capacitance
  • Communication baud rate at 106kbpws

Memory

  • User memory of 144 (NTAG 223 DNA) or 208 bytes (NTAG 224 DNA)
  • 10 year data retention
  • 100 k write cycles

Security

  • Customizable Originality Signature (48-byte based on ECC)
  • Secure Unique NFC (SUN) message authentication code protected with AES-128
  • Memory protected with 32-bit password (NTAG 223 DNA) or with mutual authentication with AES-128 bit key (NTAG 224 DNA)
  • Common Criteria EAL3+ (AVA_VAN.2) certification

Status Detection

  • Conductive or capacitive tamper status detection
  • Capacitive sensing interface to measure environmental conditions
  • Measurement range is up to 11pF with a resolution of up to 64 steps

Buy/Parametrics

2 results

Include 0 NRND

Order

CAD Model

Wafer Thickness

Tamper & Sensing

Memory Size (B)

Memory Protection

Input capacitance (pF)

120 µm

yes

144

Password

50

120 µm

yes

208

Mutual

50

Documentation

Quick reference to our documentation types.

5 documents

Compact List

Application Note (2)
Brochure (1)
Data Sheet (2)

Design Files

Hardware

Quick reference to our board types.

1 hardware offering

Software

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1 software file

Note: For better experience, software downloads are recommended on desktop.

Engineering Services

1 engineering service

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Training

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